Hitachi benchtop sample preparation systems

... device. Micro-samples are cut out or trimmed in various shape by varying the incident FIB-direction System configuration example FIB-STEM System A new-developed semiconductor ...

The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM). The MC1000 is designed to deposit a thin metal coating, such as platinum ...

... between hydrocarbons on the specimen surface and the irradiated electron beam generate sample contamination. Hydrocarbons are generally non-covalently attached to the specimen surface ...

... results and therefore very effective for rapid cross section preparation of specimens with a target structure far from the top surface. Hybrid Milling Cross section Milling A pristine surface ...

The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy. Features Cross-section milling rate: 1 mm/hour!*1 The ...

... your TEM samples. Overview Sample surfaces are inevitably contaminated with hydrocarbon due to sample preparation or storage. The ZONETEM II desktop ...