Hitachi electron microscopy sample preparation systems

... from your TEM samples. Overview Sample surfaces are inevitably contaminated with hydrocarbon due to sample preparation or storage. The ZONETEM ...

... device. Micro-samples are cut out or trimmed in various shape by varying the incident FIB-direction System configuration example FIB-STEM System A new-developed semiconductor ...

The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM). The MC1000 is designed to deposit ...

... between hydrocarbons on the specimen surface and the irradiated electron beam generate sample contamination. Hydrocarbons are generally non-covalently attached to the specimen surface ...

... results and therefore very effective for rapid cross section preparation of specimens with a target structure far from the top surface. Hybrid Milling Cross section Milling A pristine surface ...

The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy. Features Cross-section ...