Hitachi electron microscopy sample preparation systems

2 companies | 7 products
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automatic sample preparation system
automatic sample preparation system
ZONETEM II

... from your TEM samples. Overview Sample surfaces are inevitably contaminated with hydrocarbon due to sample preparation or storage. The ZONETEM ...

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Hitachi High-Tech Europe GmbH
automatic sample preparation system
automatic sample preparation system

... device. Micro-samples are cut out or trimmed in various shape by varying the incident FIB-direction System configuration example FIB-STEM System A new-developed semiconductor ...

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Hitachi High-Tech Europe GmbH
automatic sample preparation system
automatic sample preparation system
MC1000

The MC1000 Ion Sputter Coater is a sample preparation instrument for use with a Scanning Electron Microscope (SEM). The MC1000 is designed to deposit ...

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Hitachi High-Tech Europe GmbH
automatic sample preparation system
automatic sample preparation system
ZONESEMII

... between hydrocarbons on the specimen surface and the irradiated electron beam generate sample contamination. Hydrocarbons are generally non-covalently attached to the specimen surface ...

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Hitachi High-Tech Europe GmbH
automatic sample preparation system
automatic sample preparation system
IM4000II

... results and therefore very effective for rapid cross section preparation of specimens with a target structure far from the top surface. Hybrid Milling Cross section Milling A pristine surface ...

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Hitachi High-Tech Europe GmbH
automatic sample preparation system
automatic sample preparation system
ArBlade 5000

The most advanced broad ion beam system for producing exceptionally high-quality cross-section or flat-milling samples for electron microscopy. Features Cross-section ...

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Hitachi High-Tech Europe GmbH
electron microscopy sample preparation system
electron microscopy sample preparation system
ZONESEMII

... between hydrocarbons on the specimen surface and the irradiated electron beam generate sample contamination. Hydrocarbons are generally non-covalently attached to the specimen surface ...

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