Hitachi floor-standing microscopes

2 companies | 13 products
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SEM microscope
SEM microscope
SU9000 II

Magnification: 3,000,000 unit
Resolution: 0.8, 1.2, 0.4 nm

The SU9000 II is a combination of surface-imaging SEM and intrinsic structure-resolving scanning transmission microscope (STEM) optimised for extreme resolution. This is made possible by the unique electron optics of ...

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Hitachi High-Tech Europe GmbH
field emission scanning electron microscope
field emission scanning electron microscope
SU8700

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.6 nm

Equipped with a 150mm sample airlock as standard, the SU8700 offers high sample throughput even for larger samples and a constantly clean sample chamber environment for low-contamination, high-resolution imaging. In addition, the sample ...

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Hitachi High-Tech Europe GmbH
CFE-SEM microscope
CFE-SEM microscope
SU8600

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.7, 0.6 nm

The SU8600 is the successor to the proven Regulus field emission SEM family and fulfills the highest requirements for imaging-oriented applications. The cold field emitter with its near monochromatic emission, combined with a magnetic ...

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Hitachi High-Tech Europe GmbH
field emission scanning electron microscope
field emission scanning electron microscope
SU7000

Magnification: 20 unit - 2,000,000 unit
Resolution: 0.8, 0.9 nm

The SU7000 is ideal for large or heavy samples and for integrating a wide range of accessories. These accessories include analytical detectors or stage attachments for in-situ sample manipulation (stretching [tensile] / compression, heating/cooling, ...

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Hitachi High-Tech Europe GmbH
scanning electron microscope
scanning electron microscope
SU3800/3900 Family

Magnification: 5 unit - 800,000 unit
Resolution: 15, 4, 3 nm

The SU3800/3900 VP-SEM family focusses on productivity. These tools automate repetitive tasks, so you can achieve reproducible results in a short time with little manual effort. Two different sample chambers with either tungsten or ...

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Hitachi High-Tech Europe GmbH
scanning electron microscope
scanning electron microscope
FlexSEM II

Magnification: 6, 8,000,000 unit
Resolution: 15, 4 nm

FlexSEM II is a table-top / compact SEM for imaging tasks that go beyond the performance of conventional table-top SEMs. It’s the ideal system for anyone who doesn’t want to invest in a classic SEM, but also doesn’t want to compromise ...

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Hitachi High-Tech Europe GmbH
STEM microscope
STEM microscope
HF5000

Magnification: 20 unit - 8,000,000 unit
Resolution: 0.08, 0.1 nm

... sample. Thanks to the Cs-corrector, the surface can be visualised with atomic resolution. The routine and fast switching between TEM and STEM makes daily work with a fully automated Cs corrector easy, even for beginners ...

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Hitachi High-Tech Europe GmbH
TEM microscope
TEM microscope
HT7800 Series

Magnification: 1,000,000, 800,000, 600,000 unit
Resolution: 0.19, 0.14, 0.2 nm

The HT7800 family supports a wide range of applications, from life sciences to materials science. It’s available in three different pole piece variants, always based on our patented objective lens for fast switching between high contrast ...

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Hitachi High-Tech Europe GmbH
FE-SEM microscope
FE-SEM microscope
SU3800SE/SU3900SE

Magnification: 5 unit - 600,000 unit
Resolution: 0.9, 2.5 nm

The Hitachi SU3800SE and SU3900SE SEMs provide versatile imaging and analytical solutions for various applications. These instruments offer high-resolution imaging, intuitive navigation, and advanced automation, delivering reliable, consistent ...

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Hitachi High-Tech Europe GmbH
FIB-SEM microscope
FIB-SEM microscope
NX5000

Magnification: 0 unit
Resolution: 4, 60 nm

... “ETHOS” FIB-SEM platform targets advanced position-accurate applications in the areas of automated production of ultra-fine TEM lamellae for aberration-corrected TEM/STEM, high-resolution multi signal SEM examination ...

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Hitachi High-Tech Europe GmbH
FIB-SEM microscope
FIB-SEM microscope
NX9000

Resolution: 2.1, 1.6 nm

... optimized layout for true high-resolution serial sectioning to tackle the latest demands in 3D structural analysis and for TEM and 3DAP analyses. The NX9000 FIB-SEM system allows the highest precision in material processing ...

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