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Magnification: 20 unit - 2,000,000 unit
Resolution: 0.6, 0.9, 0.8 nm
The SU8700 brings in a new era of ultrahigh-resolution Schottky field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary FE-SEM platform incorporates multifaceted imaging, ...
Hitachi High-Tech Europe GmbH
Magnification: 50,000, 60,000, 10,000, 30,000, 15,000 unit
Resolution: 4, 5 nm
... installed in limited office, laboratory, or even mobile spaces. Engineered to appeal to both the novice and expert microscopist for a wide range of applications, including biological and advanced material specimens, this ...
Hitachi High-Tech Europe GmbH
Magnification: 10 unit - 250,000 unit
Weight: 54 kg
Length: 617, 614 mm
... innovation and cutting-edge technologies which redefine the capabilities of a tabletop microscope. This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 8,000,000 unit
Resolution: 0.08, 0.1 nm
... opposed dual 100 mm2 EDX* detectors : "Symmetrical Dual SDD*" Newly designed enclosure for optimum performance in real laboratory environments A wide range of Hitachi advanced specimen holders High-brightness ...
Hitachi High-Tech Europe GmbH
Magnification: 600,000, 800,000, 1,000,000 unit
Resolution: 0.14, 0.19, 0.2 nm
... cutting-edge solution for modern TEM analyses. Features Hitachi's Dual-Mode objective lens supports easy observation under low magnification, wide-field high contrast, high resolution, and more—all in one microscope. Normal ...
Hitachi High-Tech Europe GmbH
Magnification: 3,000,000 unit
Resolution: 0.4, 0.7 nm
The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam brightness and stability, affording high-resolution ...
Hitachi High-Technologies
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.6, 0.8, 0.9 nm
The SU8700 brings in a new era of ultrahigh-resolution Schottky field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary FE-SEM platform incorporates multifaceted imaging, ...
Hitachi High-Technologies
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.7, 0.6 nm
The SU8600 brings in a new era of ultrahigh-resolution cold-field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary CFE-SEM platform incorporates multifaceted imaging, automation, ...
Hitachi High-Technologies
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm
The modern FE-SEM requires not only high performance but also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous ...
Hitachi High-Technologies
... With EM Wizard, beginners become experts overnight. Automatic axis adjustment technology (auto-calibration) restores the microscope to its "best condition" on demand. A robust "draw-out" specimen chamber accommodates ...
Hitachi High-Technologies
Magnification: 10 unit - 250,000 unit
Weight: 54 kg
Width: 330 mm
... innovation and cutting-edge technologies which redefine the capabilities of a tabletop microscope. This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized ...
Hitachi High-Technologies
Resolution: 4, 60, 0.7, 50, 1.5 nm
... observation 3. Microsampling System Fully integrated sample-orientation control for Anti-Curtaining Effect (ACE technology) TEM sample preparation for uniform lamellas at any orientation 4. Triple-Beam Capable, ...
Hitachi High-Technologies
Resolution: 2.1, 1.6 nm
... optimized layout for true high-resolution serial sectioning to tackle the latest demands in 3D structural analysis and for TEM and 3DAP analyses. The NX9000 FIB-SEM system allows the highest precision in material processing ...
Hitachi High-Technologies
Resolution: 60, 4, 2.8, 3.5 nm
... technologies, supports high throughput, and high quality TEM sample preparation for cutting edge applications. * Option Features High contrast, real-time SEM end point detection allows ultrathin TEM ...
Hitachi High-Technologies
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