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Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.6 nm
Equipped with a 150mm sample airlock as standard, the SU8700 offers high sample throughput even for larger samples and a constantly clean sample chamber environment for low-contamination, high-resolution imaging. In addition, the sample ...
Hitachi High-Tech Europe GmbH
Magnification: 6, 8,000,000 unit
Resolution: 15, 4 nm
FlexSEM II is a table-top / compact SEM for imaging tasks that go beyond the performance of conventional table-top SEMs. It’s the ideal system for anyone who doesn’t want to invest in a classic SEM, but also doesn’t want to compromise ...
Hitachi High-Tech Europe GmbH
Magnification: 10 unit - 250,000 unit
Length: 617 mm
Designed as a logical extension of optical stereo microscopy, the TM4000 III is an entry-level device for scanning electron microscopy. It allows you to image samples in the shortest possible time with good resolution, depth of field, ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 8,000,000 unit
Resolution: 0.08, 0.1 nm
... sample. Thanks to the Cs-corrector, the surface can be visualised with atomic resolution. The routine and fast switching between TEM and STEM makes daily work with a fully automated Cs corrector easy, even for beginners ...
Hitachi High-Tech Europe GmbH
Magnification: 1,000,000, 800,000, 600,000 unit
Resolution: 0.19, 0.14, 0.2 nm
The HT7800 family supports a wide range of applications, from life sciences to materials science. It’s available in three different pole piece variants, always based on our patented objective lens for fast switching between high contrast ...
Hitachi High-Tech Europe GmbH
Magnification: 5 unit - 600,000 unit
Resolution: 0.9, 2.5 nm
The Hitachi SU3800SE and SU3900SE SEMs provide versatile imaging and analytical solutions for various applications. These instruments offer high-resolution imaging, intuitive navigation, and advanced automation, delivering reliable, consistent ...
Hitachi High-Tech Europe GmbH
Magnification: 0 unit
Resolution: 4, 60 nm
... “ETHOS” FIB-SEM platform targets advanced position-accurate applications in the areas of automated production of ultra-fine TEM lamellae for aberration-corrected TEM/STEM, high-resolution multi signal SEM examination ...
Hitachi High-Tech Europe GmbH
Resolution: 1.6, 2.1, 4 nm
In this unique system, the Ga-FIB and FE-SEM columns are at right angles to each other. This configuration is ideal for applications where large volumes (biological tissue, materials with large grain structures, semiconductor components, ...
Hitachi High-Tech Europe GmbH
Resolution: 2.8, 60, 4, 3.5 nm
NX2000 is a FIB-SEM optimised for semiconductor applications (defect analysis with KLARF coordinate import, TEM lamella extraction, device development). With 205 x 205 mm X,Y travel, the sample stage even allows full-surface ...
Hitachi High-Tech Europe GmbH
Magnification: 3,000,000 unit
Resolution: 0.4, 0.7 nm
The Cold Field Emission source is ideal for high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam brightness and stability, affording high-resolution ...
Hitachi High-Technologies
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.6, 0.8, 0.9 nm
The SU8700 brings in a new era of ultrahigh-resolution Schottky field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary FE-SEM platform incorporates multifaceted imaging, ...
Hitachi High-Technologies
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.7, 0.6 nm
The SU8600 brings in a new era of ultrahigh-resolution cold-field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary CFE-SEM platform incorporates multifaceted imaging, automation, ...
Hitachi High-Technologies
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm
The modern FE-SEM requires not only high performance but also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous ...
Hitachi High-Technologies
... With EM Wizard, beginners become experts overnight. Automatic axis adjustment technology (auto-calibration) restores the microscope to its "best condition" on demand. A robust "draw-out" specimen chamber accommodates ...
Hitachi High-Technologies
Magnification: 10 unit - 250,000 unit
Weight: 54 kg
Width: 330 mm
... innovation and cutting-edge technologies which redefine the capabilities of a tabletop microscope. This new generation of the long-standing Hitachi tabletop microscopes (TM) integrates ease of use, optimized ...
Hitachi High-Technologies
Resolution: 4, 60, 0.7, 50, 1.5 nm
... observation 3. Microsampling System Fully integrated sample-orientation control for Anti-Curtaining Effect (ACE technology) TEM sample preparation for uniform lamellas at any orientation 4. Triple-Beam Capable, ...
Hitachi High-Technologies
Resolution: 2.1, 1.6 nm
... optimized layout for true high-resolution serial sectioning to tackle the latest demands in 3D structural analysis and for TEM and 3DAP analyses. The NX9000 FIB-SEM system allows the highest precision in material processing ...
Hitachi High-Technologies
Resolution: 60, 4, 2.8, 3.5 nm
... technologies, supports high throughput, and high quality TEM sample preparation for cutting edge applications. * Option Features High contrast, real-time SEM end point detection allows ultrathin TEM ...
Hitachi High-Technologies
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