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Magnification: 3,000,000 unit
Resolution: 1.2, 0.7, 0.4, 0.8 nm
... usable in practical applications in your lab, the SU9000II utilizes an ultra-stable side-entry sample stage similar to high-end TEM systems and incorporates optimized vibration damping and a closed cabinet to shield the ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.7, 0.6 nm
The SU8600 brings in a new era of ultrahigh-resolution cold-field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary CFE-SEM platform incorporates multifaceted imaging, automation, ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm
The modern FE-SEM requires not only high performance but also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, and simultaneous ...
Hitachi High-Tech Europe GmbH
... system for SEM imaging that goes beyond basic preset conditions and recipes. Its ease of use opens a new gateway for material research, development, and area beyond our imagination. Overview The SU5000 FE-SEM has ...
Hitachi High-Tech Europe GmbH
Magnification: 50,000, 60,000, 10,000, 30,000, 15,000 unit
Resolution: 4, 5 nm
... for an economical analytical tool, without compromising performance. Overview The FlexSEM 1000 II Scanning Electron Microscope features newly designed electron optical and signal detection systems providing unparalleled ...
Hitachi High-Tech Europe GmbH
Magnification: 20 unit - 8,000,000 unit
Resolution: 0.08, 0.1 nm
Hitachi's unique 200 kV aberration-corrected TEM/STEM: the perfect harmony of imaging resolution and analytical performance 0.078 nm spatial resolution in STEM is achieved together with high specimen-tilt capability and large solid ...
Hitachi High-Tech Europe GmbH
Magnification: 600,000, 800,000, 1,000,000 unit
Resolution: 0.14, 0.19, 0.2 nm
... cutting-edge solution for modern TEM analyses. Features Hitachi's Dual-Mode objective lens supports easy observation under low magnification, wide-field high contrast, high resolution, and more—all in one microscope. Normal ...
Hitachi High-Tech Europe GmbH
... system for SEM imaging that goes beyond basic preset conditions and recipes. Its ease of use opens a new gateway for material research, development, and area beyond our imagination. Overview The SU5000 FE-SEM has ...
Hitachi High-Technologies
Resolution: 2.1, 1.6 nm
... optimized layout for true high-resolution serial sectioning to tackle the latest demands in 3D structural analysis and for TEM and 3DAP analyses. The NX9000 FIB-SEM system allows the highest precision in material processing ...
Hitachi High-Technologies
Resolution: 60, 4, 2.8, 3.5 nm
... technologies, supports high throughput, and high quality TEM sample preparation for cutting edge applications. * Option Features High contrast, real-time SEM end point detection allows ultrathin TEM ...
Hitachi High-Technologies
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