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... , however, the observation objects and sample holders themselves are the dominant source of contamination. Here, plasma treatment often proves to be too rough in the sense of altering or even destroying the sample. ...
Hitachi High-Tech Europe GmbH
IM4000 II is a modular computer-controlled argon ion polishing system that can be equipped as a pure surface polisher, as a cross-section polisher or as a hybrid system, depending on ...
Hitachi High-Tech Europe GmbH
... processing of several individual positions is also possible as an option; the optional multiple sample holder allows automatic processing of up to 3 samples. The ArBlade 5000 / IM5000 is equipped ...
Hitachi High-Tech Europe GmbH
... , however, the observation objects and sample holders themselves are the dominant source of contamination. Here, plasma treatment often proves to be too rough in the sense of altering or even destroying the sample. ...
Hitachi High-Tech Europe GmbH
... between hydrocarbons on the specimen surface and the irradiated electron beam generate sample contamination. Hydrocarbons are generally non-covalently attached to the specimen surface ...
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