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Magnification: 3,000,000 unit
Resolution: 0.8, 1.2, 0.4 nm
... can be mounted close to the sample for high-resolution elemental analysis in both SEM and STEM mode. Product features: - SEM-STEM combination with ExB-filtered SEM signal and scattering ...
Hitachi High-Tech Europe GmbH
Magnification: 5 unit - 800,000 unit
Resolution: 15, 4, 3 nm
... overview: Colour navigation images of the sample plates cover the entire sample area observable by SEM - Carefree operation - collisions between the stage and SEM components are virtually eliminated ...
Hitachi High-Tech Europe GmbH
Magnification: 6, 8,000,000 unit
Resolution: 15, 4 nm
FlexSEM II is a table-top / compact SEM for imaging tasks that go beyond the performance of conventional table-top SEMs. It’s the ideal system for anyone who doesn’t want to invest in a classic SEM, ...
Hitachi High-Tech Europe GmbH
Magnification: 10 unit - 250,000 unit
Length: 617 mm
Designed as a logical extension of optical stereo microscopy, the TM4000 III is an entry-level device for scanning electron microscopy. It allows you to image samples in the shortest possible time with good resolution, ...
Hitachi High-Tech Europe GmbH
Resolution: 2.8, 60, 4, 3.5 nm
NX2000 is a FIB-SEM optimised for semiconductor applications (defect analysis with KLARF coordinate import, TEM lamella extraction, device development). With 205 x 205 mm X,Y travel, the sample stage ...
Hitachi High-Tech Europe GmbH
Magnification: 3,000,000 unit
Resolution: 0.4, 0.7 nm
... high-resolution imaging with a small source size and energy spread. Innovative CFE Gun technology contributes the ultimate FE-SEM with superior beam brightness and stability, affording high-resolution imaging and high-quality ...
Hitachi High-Technologies
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.6, 0.8, 0.9 nm
The SU8700 brings in a new era of ultrahigh-resolution Schottky field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary FE-SEM platform ...
Hitachi High-Technologies
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.7, 0.6 nm
The SU8600 brings in a new era of ultrahigh-resolution cold-field emission scanning electron microscopes to the long-standing Hitachi EM lineup. This revolutionary CFE-SEM platform incorporates ...
Hitachi High-Technologies
Magnification: 20 unit - 2,000,000 unit
Resolution: 0.9, 0.8 nm
The modern FE-SEM requires not only high performance but also a multitude of functionalities including wide-area observation, in-situ analysis, variable pressure, high-resolution imaging at low accelerating voltages, ...
Hitachi High-Technologies
Magnification: 10 unit - 250,000 unit
Weight: 54 kg
Width: 330 mm
... tabletop microscopes with the Hitachi TM4000 II and TM4000Plus II. Features Intuitive operation on Camera Navi * Use of optical images helps navigate to target observation area easily. Obtained SEM ...
Hitachi High-Technologies
Resolution: 4, 60, 0.7, 50, 1.5 nm
The Hitachi Ethos FIB-SEM incorporates the latest-generation FE-SEM with superb beam brightness and stability. Ethos delivers high-resolution imaging at low voltages combined with ion optics for nanoscale ...
Hitachi High-Technologies
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