TESCAN benchtop microscopes

Magnification: 1,000,000 unit

... SEM and FIB-SEM instruments. An operator who learns on TESCAN VEGA Compact can easily make the transition to other TESCAN microscopes or adapt some features of the Essence software environment to match the GUI of other ...

TESCAN VEGA’s 4th generation Scanning Electron Microscope (SEM) with tungsten filament electron source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ software. This ...

TESCAN MIRA’s 4th generation Scanning Electron Microscope (SEM) with FEG Schottky electron emission source combines SEM imaging and live elemental composition analysis in a single window of TESCAN’s Essence™ software. ...

Field-free analytical UHR SEM for materials characterization at the nanoscale Uncompromised characterization of all types of materials at the nanoscale Ideal for characterization of materials at low beam energies for maximum surface ...

UHR SEM for nanomaterials characterization at sub-nanometer scale High-resolution and high-contrast imaging of nextgen materials (e.g. catalyst structures, nanotubes, nanoparticles and other nanoscale structures) Excellent platform ...

... equipped with a special in-chamber microtome is able to analyze volumes of exceptional dimensions in the field electron microscopy – blocks of almost one cubic millimeter can be examined.This allows us to understand ...

All-purpose Ga FIB-SEM for cryo and room temperature structural analysis TESCAN AMBER for Life Sciences represents a cutting-edge Ga FIB-SEM solution that offers multifunctional capabilities for the structural analysis of biological ...

The TESCAN AMBER X is a high-performance focused plasma ion beam-scanning electron microscope (FIB-SEM) for extra-large volume analysis and high throughput cryo applications. Equipped with the iFIB+ column, TESCAN AMBER ...